Fig. 3.
Surface and thermal characterization of hybrid constructs. (A) X-ray diffraction (XRD) pattern of PCL-chips and all SANF constructs. (B) Differential Scanning Calorimetry (DSC) melting thermograms of PCL-chips and all SANF constructs. (C) DSC crystallization thermograms of PCL-chips and all SANF constructs.