The structure of nanocomposites was studied using XRD andTEM analysis. A Philips PW1050 diffractometer was used to
obtain the X-ray diffraction patterns using Cu Ka lines(l = 1.5406 A˚ ).
The diffractrograms were scanned from 2.58 to188(2u) in steps of 0.028 using a scanning rate of 0.58/min.