This phenomenon was also observed by Zhong and Lima (2003), who found that electrical field strength and endpoint temperature significantly impacted the vacuum drying rate of sweet potato, and that optimal values existed for each treatment parameter
This phenomenonwas also observed by Zhong and Lima (2003), whofound that electrical field strength and endpoint temperaturesignificantly impacted the vacuum drying rateof sweet potato, and that optimal values existed for eachtreatment parameter