As shown in Fig. 2[25], the modeling of the AFM tip-graphene interactions, where the lateral force was calculated as the sum of y-components of all van der Waals forces acting between the atoms of the CNT tip and those of graphene layers, demonstrated that the friction force decreases as the number of layers increases; that conclusion was also supported by the experimental AFM measurements [27]. That friction is dominated by the contribution from out-of-plane deformation, the so-called mechanism of ‘puckering’ in front of the scanning tip ( Fig. 3d), which increases the contact area and, therefore, the amount of friction.