X-rays strike the sample and promote elemental fluorescence. Some Si fluorescence at the surface of the detector escapes, and is not collected by the detector. The result is a peak that appears in spectrum, at: Element keV -Si keV (1.74 keV)
X-rays strike the sample and promote elemental fluorescence.Some Si fluorescence at the surface of the detector escapes, and is not collected by the detector.The result is a peak that appears in spectrum, at: Element keV -Si keV (1.74 keV)