Scanning electron microscopy (SEM) analysis
The structure of the dried pumpkin slices was examined using a scanning electron microscope SEM Quanta 250 FEI with X-ray and WetSTEM detector. To analyze the changes produced by the drying temperatures which can affect the cellular structure of dried products, the samples were identically prepared (same size). Thin slices of about 1 mm thick were cut from the dried samples, fixed on the SEM stub and studied under the same conditions: High Vacuum mode at a pressure 100 kPa, mag 600×.