Fourier transform infrared (FT-IR) spectrum of the nanocomposite
film samples was analyzed using FT-IR spectroscopy (TENSOR 37 spectrophotometer
with OPUS 6.0 software, Billerica, MA, USA) operated at
a resolution of 4 cm−1.
For this, samples were placed on the ray exposing
stage and the spectrum for each sample was recorded between the
wave number ranges of 500–4000 cm−1.