Fig. 4 Characterization of nanomaterial alignment and density. (a)
Optical image of a 0.10 wt% SiNW-BBF on 150 mm Si wafer. Insets,
dark-field (DF) optical images showing aligned SiNWs at different
locations. Scale bar: 10 mm. (b) The NW spacing and density versus NW
loading plot. Insets, two DF optical images taken from 0.03 and 0.15 wt%
SiNW-BBFs. Scale bars: 20 mm (left), 10 mm (right). Adapted from Ref. 27.