(a), for PLLA50/PDLA50 blends prepared by low temperature approach and melt blending, WAXD profiles exhibit three main diffraction peaks at 2θ values , assigned to the (110) planes, (300) and/or (030) planes, and (220) planes of PLA stereocomplex crystallites. The crystallinities of the stereocomplex crystallites estimated by WAXD measurements, are above 50% at processing temperatures of 160, 180, and 200 ℃