The WAXD and DSC
data are included in Table 1. From Fig. 1(a), for PLLA50/PDLA50
blends prepared by low temperature approach and melt blending,
WAXD profiles exhibit three main diffraction peaks at 2q values of
11.6, 20.6, and 23.5 , assigned to the (110) planes, (300) and/or
(030) planes, and (220) planes of PLA stereocomplex crystallites
(trigonal unit cell of dimensions: a ¼ b ¼ 1.498 nm, c ¼ 0.870 nm,
a ¼ b ¼ 90 , and g ¼ 120 ) [18]. The crystallinities of the stereo-
complex crystallites (Xc(sc)) estimated by WAXD measurements,
are above 50% at processing temperatures of 160, 180, and 200 C.