Abstract—Generally, the measurement of radio frequency (RF)
noise filtering capability is a necessary part in the design of
integrated circuit productions. In this paper, the authors propose
a universal integrated circuit RF noise filtering capability
measurement method—RF anechoic chamber. During the test,
we put the integrated circuit in anechoic chamber, which
provides a controllable RF signal electrical level, standing for the
interface intensity when the integrated circuit works. By measure
the results from voltmeter, we get the RF noise filtering
capability of the integrated circuit. This novel measurement
method is useful for selecting IC method and helpful to get a
suitable integrated circuit which could resist the RF noise.
Keywords-RF; anechoic chamber; integrated circui