FEOL involves Plasma-stripping photolithographic mask and impurities after ion implantation or etching. MEI wet benches have excellent FEOL Cleaning capabilities
Aqueous-based residue removal and cleaning using SPM (sulfuric acid and hydrogen peroxide mixture) or O3 (ozonated) DI H2O (deionized H2O)
Critical surface cleaning and surface conditioning prior to gate oxide deposition using SC-1/SC-2 (RCA Standard Clean 1 and 2), HF or dilute ozonated SC-1, dilute SC-2 and dilute HF (dHF) solution
Rinsing with DI H2O
Wafer drying using IPA (isopropyl alcohol) in preparation for thigh-temperature oxide growth or poly silicon deposition or metal sputtering