This
procedure is identical to that of test condition C,
except that the pull is applied by inserting a hook under the lead wire
(attached to die, substrate or header or both ends) with the
device clamped and the pulling force applied approximately in
the center of the wire in a direction approximately normal to
the die or substrate surface or approximately normal to a
straight line between the bonds. When a failure occurs, the
force causing the failure and the failure category shall be
recorded. The minimum bond strength shall be taken from
Table 1. Figure 1 may be used for wire diameters not specified
in Table 1. For wire diameter or equivalent cross section
>125 μm, where a hook will not fit under the wire, a suitable
clamp can be used in lieu of a hook.