The films and powders were characterized by different techniques like diffuse reflectance UV–Vis spectroscopy (DRS), X-ray diffraction (XRD) and scanning electron microscopy equipped with energy dispersive X-ray microanalysis (SEM-EDX).
The films and powders were characterized by different techniques like diffuse reflectance UV–Visspectroscopy (DRS), X-ray diffraction (XRD) and scanning electron microscopy equipped with energydispersive X-ray microanalysis (SEM-EDX).