The accuracy, relevance, sensitivity and availability
of XRD increase its roles in various fields. But one
question which might be appeared, what are the
limits that it might be faced. It can only analyze single phase at a time, need controlled diffracted
patterns, low sensitivity for mixed complex hybrid
mixture and sometimes hybrid peaks appeared for
high angel reflections. So, advanced simulation
methods are preconditioned to fix the problems to
get more appreciation of the XRD wealth information.
Development of easier data interpretationmethods
are also appreciating for both in laboratories
and industrial applications. For carbon based
nanomaterial, XRD takes prolonged time to simulate
all structural properties. Therefore, there is necessary
to build a common control library of simulated
controlled diffracted patterns of various
nanomaterial phases which would occupy all structural
properties of thosematters. ItwouldmakeXRD
pattern diffraction peak analysis easier, faster, sensitive
and less time-consumingmethod in future not
only for carbon matters but also for others.