Fig. 1 shows XRD patterns of Ag0.15–(SiO2)0.85, TiO2 and TiO2/
Ag0.15–(SiO2)0.85 thin films. A broad diffraction peak is observed
at 25 for all samples, which corresponds to the amorphous SiO2
matrix and/or the glass substrate [24]. The lowest graph also
shows the typical peaks of cubic Ag phase (PDF#04-0783), attributable
to the (111), (200) and (220) planes, respectively, indicating
that the Ag NPs presents inside the SiO2 matrix. The structure of
TiO2 film can be assigned to anatase–TiO2 (PDF#21-1272), with
the presence of characteristic (101), (200) and (211) peaks, which
demonstrates that the anatase–TiO2 structure film can be obtained