The X-ray diffraction results from our annealed samples is summarized in Table III.
We list the experimental intensities, normalized by the multiplicity, structure and
Debye-Waller factors of a random polycrystal for the most intense aluminum reflections.
Note that only the relative intensities of the various peaks of a particular sample are meaningful due to the differences in areas of the measured samples. All of the samples
except E exhibit a strong preferred (111) orientation. While the layered films have only this orientation, all of the films deposited from a composite target contain some (220) texture. Sample E has a (220) texture to the exclusion of all other orientations. This fact has also been confirmed by ED.