Particle size distribution was derived from a histogram
considering more than 400 particles measured using multiple
TEM micrographs. X-Ray diffraction (XRD) analysis was done
using a diffractometer (Philips X0
pert PRO, The Netherlands) of
Cu-Ka wavelength (l ¼ 1.54 A). For XRD analysis, samples were ˚
prepared as discussed in our previous study