To determine the crystalline
structure of the irradiated samples, a sample of 1 1 cm2 was
placed in a sample holder for X-ray diffractometry. The X-ray diffraction
patterns were recorded in the reflexion mode in an angular
range of 5–60° (2θ) at room temperature using a diffractometer
Siemens model D5000 (Karlsruhe, Germany), with a
Bragg Brentano geometry and monochromatic CuKα radiation
(λ¼1.5418 Å), at 34 kV, and 20 mA. The molecular weights of PLA
samples were determined by gel permeation chromatography
(GPC) an Agilent PL-GPC 50 system (Santa Clara, CA) was used in
combination with a differential refractive index detector Agilent
1260 Infinity. The column set consisted of two PLgel columns of
5 μm Mixed D with 300 mm of length and 7.5 mm of diameter.
To determine the crystallinestructure of the irradiated samples, a sample of 1 1 cm2 wasplaced in a sample holder for X-ray diffractometry. The X-ray diffractionpatterns were recorded in the reflexion mode in an angularrange of 5–60° (2θ) at room temperature using a diffractometerSiemens model D5000 (Karlsruhe, Germany), with aBragg Brentano geometry and monochromatic CuKα radiation(λ¼1.5418 Å), at 34 kV, and 20 mA. The molecular weights of PLAsamples were determined by gel permeation chromatography(GPC) an Agilent PL-GPC 50 system (Santa Clara, CA) was used incombination with a differential refractive index detector Agilent1260 Infinity. The column set consisted of two PLgel columns of5 μm Mixed D with 300 mm of length and 7.5 mm of diameter.
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