A more accurate, although more time-consuming, method for
crystallinity index determination is the deconvolution method, in
which by use of specific software amorphous and crystalline
contributions to the diffraction spectrum are separated using
a curve-fitting process. Curve-fitting requires that the shape
and number of peaks are assumed. In the current contribution
Lorentzian functions have been chosen for XRD spectra deconvolution.
CI is calculated from the ratio of the area of all deconvoluted
crystalline peaks to the total diffractogram area (Fig. 4(b)).