The Hot Disk Thermal Constants Analyzer is an emerging technology that uses the transient plane source technique to measure the in-plane and through-plane thermal conductivity of an anisotropic material in the same test [1-5]. The sensors used in this test method consisted of a 10µm thick nickel foil embedded between two 25.4 µm thick layers of Kapton polyimide film. The nickel foil was wound in a double spiral pattern and had a radius, R of either 3.189 mm or 6.403 mm. For the more conductive samples the sensor with the larger radius was used. The thermal conductivities were measured at 23oC. Since the test specimens are anisotropic, this test method is useful for this project.