The structural characterization of the samples was carried out by the powder X-ray diffraction (XRD) technique using Bruker D8 Advanced diffractometer and the data were analyzed by Rietveld refinement using Fullprof software. Micro structural studies of the samples were carried out using a Scanning Electron Microscope (Model: JSM- 6700F). Magnetic properties were studied using a Physical Property Measurement System (PPMS) (PPMS – 9, QUANTUM DESIGN, America). The magnetization studies were carried out in the temperature range, 4–300 K in a 0.03 T field. The M–H measurements were investigated using a Vibrating Sample Magnetometer (VSM, Lakeshore7407, America) at room temperature. Finally, the dielectric constant measurements were also performed using a Dielectric Measurement System (DMS, Puslte–2000H, China) from room temperature to 800 K.