The X-123SDD Amptek X-ray spectrometer was used to get the
X-ray fluorescence spectra. It incorporates a silicon drift detector
(SDD), a preamplifier, a digital pulse processor (DPP) and a multichannel
analyzer (MCA), giving a resolution between 125 and
140 eV. The X-ray source was an Amptek Mini-X-Ag emitting in
the range from 5 keV to 50 keV.