The current-voltage characteristics of the encapsulated devices were measured in
air under illumination with 100mW/cm2 simulated solar light. The film thickness and the surface profile were
characterized by a KLA-Tencor D-120 profiler. The sheet resistance was measured using a four-point probe system. The
UV -vis transmission spectra were measured using a UV -Vis spectroscopy (MAPADA UV -3100).