Cobalt-Copper ferrite samples sintered at 600 C are subjected to X-ray diffraction to calculate the
average particle size using Debye Scherrer formula. The FT-IR spectra of these samples are recorded to
ensure the presence of the metallic compounds. The variations of dielectric constant and dielectric loss for
all the samples have been studied as a function of frequency. The crystalline structure of composite nano
particles are characterized by Transmission Electron Microscope (TEM).