In the present work, TiO2 NPs were prepared by a
sonochemical method according to previous study [9].
B.Characterization of Synthesized TiO2 Nanoparticles
The X-ray diffraction (XRD) patterns of nanoparticles were
carried out with a diffractometer (Philips PANalytical X’Pert
Pro) using Cu Kα radiation at 45 kV and 40 mA. Size
characterization of the 0.1 % w/v TiO2 NPs sample dispersed
in 10 mM NaCl was made on a ZetaSizer Nano ZS at 25°C.
Particle size distribution obtained from Zetasizer Nano ZS.
Size and surface topography of the TiO2 nanoparticles were
investigated using AFM Shimadzu Scanning Prop Microscope
SPM-9600 and high resolution surface images were produced.