The surface morphologies and microstructures of the diamond/
graphite films were characterized by field emission scanning
electron microscope (FESEM, Zeiss-SUPER 55) and transmission
electron microscope (TEM, FEI, Tecnai G2 F20). The identification of
carbon sp2/sp3 configuration incorporated in the diamond/graphite
films were investigated by Raman spectroscopy (Horiba, HR Evolution)
with an excitation wavelength of 325 nm. The X-ray
diffraction characterization was carried out on an X-ray diffraction
instrument (XRD, Rigaku, RINT 2000).