Dark I-V measurements have been used to evaluate the electrical performance of photovoltaic cells and
diodes for many years. Since 1960s, both light I-V and dark I-V measurements have been commonly used
to analyse the effects on cell performance of series resistance and other parameters. The dark I-V
measurement procedure does not provide information regarding short-circuit current, but is more sensitive
than light I-V measurements in determining other parameters like series resistance, shunt resistance,
ideality factor, and saturation current that dictate the electrical performance of a photovoltaic device.