Security holograms are perspective for document and product authenticity protection due to diƥculties of suucch a protection mark falsi¿cation. The quality of security holograms and master-matrices signi¿cantly depends on perfection of difffraction grating. We represent the quality inspection method of security hologram based on indirect measurements of diffractionn grating parameters. The theoretical results of our method application for quality inspection are shown in this paper.
© 2015 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license © 2015 The Authors. Published by Elsevier B.V.
(Peerhttp://creativecommons.org/licenses/by-nc-nd/4.0/-review under responsibility of the National ). Research Nuclear University MEPhI (Moscow Engineering PPhysics Institute). Peer-review under responsibility of the National Research Nuclear University MEPhI (Moscow Engineering Physics Institute) Keywords: security holograms; master-matrix; quality inspection; diffraction grating.