30 nm Pd0.92–Y0.08 thin films were deposited on fused quartz substrates by a BESTECH sputtering system, as shown in Fig. 1.The substrates were ethanol ultrasonically cleaned and pre-coatedwith 5 nm Ti to promote adhesion for the sensitive layer. Three-inch Pd and Y targets were installed to the DC and RF sources of the sputtering system, respectively. Under 0.5 Pa sputtering pres-sure of Ar, the deposition power was controlled to 100 W for Pd and 150 W for Y, which corresponded to the deposition rate of 1.3 and 0.2˚A/s, respectively. The sputtering time was approximately 200 s.Meanwhile, a silicon wafer was placed in the chamber for further characterizing of the deposited film. Half area of which was covered with adhesive tape.