2.4. Characterizations
Fourier transform infrared (FTIR) spectroscopic measurements were performed using a FTIR spectrometer
(Bruker TENSOR 27). FTIR samples were prepared using KBr in order to make small tablets; the analyses were
conducted within the range 4000 - 400 cm-1.
X-ray diffraction (XRD) measurment were observed using Bruker AXS advanced x-ray solutions GmbH. XRD
patterns were obtained at room temperature in the range of 2