To record reflection spectra of undoped Sr2SiO4 samples in the
range from 150 to 350 nm a BaMgAl10O17:Eu2þ (BAM:Eu) coated
integration sphere was mounted into the sample chamber of the
VUV spectrometer. In order to obtain the reflection spectra the
following procedure was conducted: firstly, an excitation scan
from 150 to 350 nm with BAM:Eu is recorded. Subsequently, the
excitation scan of the sample is recorded (please note that both
scans contain the same information about the excitation of
BAM:Eu, as the integrated sphere is also coated with BAM:Eu).
For this reason, the excitation scan can be divided by the
excitation scan of BAM:Eu monitored under the same conditions
to obtain the reflection spectrum.