Fig. 2. Representative output and transfer characteristics of (a) a dual layer SiP3HT FET (density of Si nanowire loading: ~0.4 per 10 10 mm2) and (b) a pristine P3HT FET. The
measurement was performed at room temperature under ambient air environment, after N2 annealing at 150 C for 5 min. The channel length and width of these devices are 20 and
500 mm, respectively.