Hi Parn,
I compared all PT parameters with baseline OP00Z and OP00-1Z (see the attached pdf).
It is strange, but seems the FT low yielding lot is the only OP00Z-2Z metal option.
I’m sorry I can’t open these spd FT datalog files, you have attached (datalogs are not in Maxvision).
I could be wrong (I checked just few records from text file) but these bin#11 rejects failed marginally, right?
· Could you please plot and share distributions from tests which are yield loss killer?
Since this lot yielded very high at WS (the best sublot), and this is the only die/chip with -2Z metal option, we need to consider setup problem.
As you know, the parent lot#J39023 contains three die/chip versions (see the table below):
· Could you check how yielded at FT these two remaining subsplits (metal option) listed below?
Ø OP00Z: JAGN9A056 wafers 1..20 - WS yield much worse than version -2Z
Ø OP00Z-1Z: JAGO0A057F wafers 21..23 - WS yield worse than version – OP00Z-2Z but better than OP00Z
Ø OP00Z-2Z: JAGO1A058G wafers 24+25 – low yield at FT
· Is it possible, that these two wafers were wrongly trimmed at WS?
(i.e. as a different metal option OP00Z or OP00Z-1Z) and now when assembled fail at FT when tested on correct setup for -2Z?
BTW. I can’t find any datalog, just maps. Is it a “DOS” setup, so datalogs are lost after sort (setup: OP00Z_3TP_8IN_DOS)
BTW2 I’d like to know what was criteria that someone decided OP00Z is CloudData BU…
Regards,
Andrzej