In addition, other contributions to the peak broadening of the X-ray reflections for both coatings are related to the grain
size variations; the larger the y-intercept, the smaller the grain size. By the virtue of the formula for crystallite size (Eq. (2))
[24], TiAlN/CrN coatings were observed to have a smaller crystallite size than TiAlN coatings. This is again in agreement with
results found by Chang et al. [31], where the multilayered TiAlN/CrN is rationalised to have interrupted film growth at each
layer due to the substrate rotation during deposition which limits the ion bombardment from two separate cathodes (Cr and
TiAl), thus resulting in a much smaller crystallite size compared to the TiAlN monolayered coating.