The maximum temperature of any process fluid in contact with the load shall be controlled below the temperature which would cause degradation of the device(s) which the WD is intended to process (see ISO/FDIS 15833-1:2004, 4.1.4). 5.1.2
The load carrier intended to accommodate the device(s) to be processed shall be designed and constructed to minimize the possibility of damage to the device(s) at the time of loading, during processing and during the course of unloading.