Abstract
Automatic inspection of security hologram (SH) identity is highly demanded issue due high distributioon of SH worldwide to protect documents such as passports, driving licenses, banknotes etc. While most of the known approachhes use inspection of SH design features none of these approaches inspect the features of its surface relief that is a direct contributioon to original master matrix used for these holograms production. In our previous works we represented the device that was deveeloped to provide SH identification by processing of coherent responses of its surface elements. Most of the algorithms used in thiss device are based on application of correlation pattern recognition methods. The main issue of the present article is a descriptioon of these methods application specificities.
© 2015 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license © 2015 The Authors. Published by Elsevier B.V.
(Peerhttp://creativecommons.org/licenses/by-nc-nd/4.0/-review under responsibility of the National ). Research Nuclear University MEPhI (Moscow Engineering PPhysics Institute). Peer-review under responsibility of the National Research Nuclear University MEPhI (Moscow Engineering Physics Institute) Keywords: security holograms; automatic identification; optical-electronic scanner; distortion invariant pattern recognition..