To demonstrate such feasibility, Cu/Ge/Pd and Cu/Pt/Ti/Pt
structures were applied to the half wafer of the InGaP/InGaAs/Ge
triple-junction solar cells as frontside and backside contacts.
Conventional n-type ohmic metal (Au/Ni/Ge/Au) and p-type ohmic
metal (Au/Pt/Ti) were deposited on the other half of the same
wafer for direct comparison