energy resolution (around 10 eV) is

energy resolution (around 10 eV) is sufficient. Another method is to determine the chemical shifts of the characteristic X-Ray
emission lines and the changes of their lineshapes but in this case a higher energy resolution (below 1 eV) is required. Gohshi
and co-workers (Gohshi Y., Ohtsuka A., 1973; Gohshi Y., Hirao O., Suzuk I., 1975) were the first to report quantitative
chemical state analysis of S, Cr and Sn based on the energy shifts of the characteristic X-Ray emission lines. Kav