Fig. 1a–d shows the FE-SEM images of PTO and PZT films before and
after the γ irradiation. The PTO films consist of many large grains with a
grain size of about 100 nm and just very small amount of void exists between
the grains of the films. On the other hand, the PZT films consist of
large grains composed of 150 nm or more sizes and small amount of
surface fluorite [4] with fine grains (indicated by yellow arrows in
Fig. 1b and d), but they have a dense structure without any voids.
There are no noticeable changes in the morphologies of both PTO and
PZT films before and after the irradiation. Fig. 1e and f shows the XRD
patterns of PTO and PZT films with various irradiation total doses, respectively.
The XRD patterns indicate that both films have polycrystalline
structures and consist of perovskite phases without any
pyrochlore phases. The PTO films are randomly oriented, but the PZT
films are highly oriented along the (111) plane. The XRD patterns of
both films before and after the irradiation show that the intensities, positions,
and full widths at halfmaximumof peaks were not significantly
Fig. 1a–d shows the FE-SEM images of PTO and PZT films before andafter the γ irradiation. The PTO films consist of many large grains with agrain size of about 100 nm and just very small amount of void exists betweenthe grains of the films. On the other hand, the PZT films consist oflarge grains composed of 150 nm or more sizes and small amount ofsurface fluorite [4] with fine grains (indicated by yellow arrows inFig. 1b and d), but they have a dense structure without any voids.There are no noticeable changes in the morphologies of both PTO andPZT films before and after the irradiation. Fig. 1e and f shows the XRDpatterns of PTO and PZT films with various irradiation total doses, respectively.The XRD patterns indicate that both films have polycrystallinestructures and consist of perovskite phases without anypyrochlore phases. The PTO films are randomly oriented, but the PZTfilms are highly oriented along the (111) plane. The XRD patterns ofboth films before and after the irradiation show that the intensities, positions,and full widths at halfmaximumof peaks were not significantly
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