The crystal structures of the powdered materials were studied by X-ray diffraction analysis. The diffractograms of the samples were obtained by using a Brucker (GB) diffractometer D8 (Bruker, GB) with a goniometer of 17 cm in the range 2Q of 10e80. Cu Ka1 (l ¼ 0.15418 nm) radiation was used for angular range of 2Q < 35 and Cu Ka2 (l ¼ 0.15405 nm) for the range of 2Q > 35. A scintillation detector was used.