Because of the thickness and the geometry of the samples,preliminary measurements showed that the instrument is not ade-quate for complex assembled components. The spectrophotometer was used to measure reflectance and transmittance of the single PC layers used to assemble the component. Reflectance measure-ments were carried out versus a calibrated reference in Spectralon. Broad band values were calculated starting from the spectral data in compliance with EN 410 standard [25–27].