Capacitive-resistive field computations are carried out around post-type HV insulators of varying
shapes. Thc boundary clcment method (UEM) has been employed for clectric field coinyutations.
Different insulator shapes havc bccn obtained by varying scvcrd parameters, which
definc the shape of the HV insulator contour. For each insulator shape, tlic maximum stress
occurring on the insulator surfacc has been dctcrmined with no surface pollution, uniform
surface pollution and also partial surface pollution. For partial pollution, scvcral cases havc
bccn studied, in which differcnt sections of the insulator surface are pollutcd. Furthennorc,
thc cffect of elcctrode radius on the maximuin stress on insulator surface bas been investigatcd.
The results obtained are presented in this paper in dctail.