A new EAC cavity filling material was introduced that had a lower CTE than the old material (Section IV-B). At TC-Q1800, TC-B750, TC-R750, no intrinsic EAC sidewall delam was observed. Fig. 16 shows the SEM images on Cross section of a passing TV with the new cavity material post TCQ500. Good sidewall integrity is observed. Reliability data collection on thus far has shown no fails up to TC-B 750 cycles. Please note that the TC-Q, TC-B, and TC-R are the thermal cycling modes as specified in the JEDEC standards.