where e0 and g0 are the dielectric constant of the gap medium
and initial gap, respectively, V is the applied bias voltage
to the upper and lower substrates, and w is the flexural
deflection of the micro-beam. q is the density and A is the
cross-section area of the micro-beam. Where ~E is the effective
elasticity modulus and equal to E for narrow beams
(b < 5 h), and equal to E/(1 m2) for wide beams (bP5 h),
I is the moment of inertia of the beam cross section. f is the
stretching force and is created when a fixed–fixed beam is
in bending, given by f ¼ ~EA
2L R L
0
@w
@x2dx. Because of the nonlinearity
of the governing equation, the SSLM [15] is used to
solve the nonlinear static equation.