CONCLUSION
Managing the impact of temperature on circuit functionality
becomes increasingly complex as technology scales. To avoid
overheating and timing failures in multivoltage systems, awareness
of the I − T dependence at each voltage (and process
point) is critical. This brief has presented the first fabricated
temperature-dependence sensor to efficiently and accurately detect
both positive and negative I − T slopes. This dependence
sensing will be critical for handling temperature-related delay
changes as positive I − T slopes become observable closer to
VDD. The proposed process compensation method can help
maintain sensor accuracy and functionality, despite process
variations or device aging. The dependence sensor is accurate
to within 1.3 ◦C and dissipates 310 nJ per sample at a supply
voltage of 3.3 V with a 20-μs sample latency