on the trapped charge carriers produced after irradiation
exposure and the radiative recombination efficiency of
these charges freed by thermal stimulation. The thermally
stimulated light emission is commonly referred as TL and
is widely used for dose assessment practices to measure different
kinds of radiation doses [5].
The TL phenomenon is the result of releasing electrons
trapped by some defects within the material lattice when
exposed to any type of ionizing radiation. The stimulation
energy to release these electrons trapped is usually thermal
and those defects are in the form of electrons or holes traps.
If these traps are energetically deep enough, charge carriers
may remain trapped for an extended period of time until
they acquire enough thermal-energy to increase the probability
to escape, producing electromagnetic radiation after
a radiative recombination process takes place. The relationship
between the TL signal intensity and the irradiation