2.3.2. X-ray diffraction rocking curve method
The texture degree of thin films annealed at 500 °C for 1 h has been
determined by X-ray diffraction rocking curve method [19–21]. Herein,
the rocking curve method was applied to the (110) peak of α-phase
taken from the X-ray diagram. A Lorentzian fit was applied to the
(110) peak and the parameters are given in Table 2, where it is noted
that the (110) peak corresponds to 2θ = 44.80° (i.e. θ = 22.40°).
In X-ray diffraction rocking curve method, X-ray source and detector
were fixed in a position that corresponds to 2θ of Bragg's peak (110).