where, R depends on the angle θ and type ofmaterial, and its calculation
requires knowledge of the crystal structure and lattice parameters of
both phases. The calculation results that correspond to both diffraction
peaks: (111) of γ-phase and (110) of α-phase are presented in
Tables 2 and 4. Table 4 reveals that as-grown thin films contain 94% of
α-phase and 6% of γ-phase, thin films that are annealed at 500 °C contain
59% ofα-phase and 41% of γ-phase, and thin films that are annealed
at 600 °C contain 51% of α-phase and 49% γ-phase. These results are in
good agreement with those obtained for sputtered 304 stainless steel
thin films after annealing at 700 °C which present a complete transformation
of α-phase to γ-phase [