This project presented a study on creep behavior and microstructure of Sn-Cu-Sb lead-free solders at room temperature. Indentation creep test was performed to investigate the creep behavior. The stress exponent of creep model was determined from the plot between ln (HV) and ln (t). Results showed that the stress exponents of the solders are higher than 6 indicating dislocation creep behavior. In addition, the solders with a larger grain size provided a higher stress exponent value.